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RO2103A
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Ideal for 418 MHz Transmitters in the U.K. and U.S.
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Very Low Series Resistance
Quartz Stability
Surface-Mount, Ceramic Case with 21 mm 2 Footprint
Complies with Directive 2002/95/EC (RoHS)
418.0 MHz
SAW
The RO2103A is a true one-port, surface-acoustic-wave (SAW) resonator in a surface-mount, ceramic case.
It provides reliable, fundamental-mode, quartz frequency stabilization of fixed-frequency transmitters
operating at 418.0 MHz. This SAW is designed for remote-control and wireless security transmitters operating
in the United Kingdom under DTI MPT 1340 and in the USA under FCC Part 15.
Absolute Maximum Ratings
Resonator
Rating
CW RF Power Dissipation (See Typical Test Circuit)
DC Voltage Between Terminals (Observe ESD Precautions)
Case Temperature
Value
+0
±30
-40 to +85
Units
dBm
VDC
°C
Soldering Temperature (10 seconds / 5 cycles max.)
260
°C
SM-2 Case
Electrical Characteristics
Characteristic
Sym
Notes
Minimum
Typical
Maximum
Units
Frequency (+25 °C)
Insertion Loss
Quality Factor
Nominal Frequency
Tolerance from 418.000 MHz
Unloaded Q
50 Ω Loaded Q
f C
Δ f C
IL
Q U
Q L
2, 3, 4, 5
2, 5, 6
5, 6, 7
417.925
1.0
16,100
1,700
418.075
±75
2.0
MHz
kHz
dB
Temperature Stability
Turnover Temperature
T O
10
25
40
°C
Turnover Frequency
f O
6, 7, 8
f C
Frequency Temperature Coefficient
FTC
0.032
ppm/°C 2
Frequency Aging
Absolute Value during the First Year
|f A |
1, 6
10
ppm/yr
DC Insulation Resistance between Any Two Terminals
5
1.0
M Ω
RF Equivalent RLC Model
Motional Resistance
Motional Inductance
Motional Capacitance
R M
L M
C M
5, 6, 7, 9
12
74.8223
1.93705
26
Ω
μH
fF
Test Fixture Shunt Inductance
Transducer Static Capacitance
C O
L TEST
5, 6, 9
2, 7
1.6
1.9
80
2.2
pF
nH
Lid Symbolization
CAUTION: Electrostatic Sensitive Device. Observe precautions for handling.
Notes:
106
1.
2.
3.
4.
5.
6.
Frequency aging is the change in f C with time and is specified at
+65°C or less. Aging may exceed the specification for prolonged tem-
peratures above +65°C. Typically, aging is greatest the first year after
manufacture, decreasing in subsequent years.
The center frequency, f C , is measured at the minimum insertion loss
point, IL MIN , with the resonator in the 50 Ω test system (VSWR ≤
1.2:1). The shunt inductance, L TEST , is tuned for parallel resonance
with C O at f C . Typically, f OSCILLATOR or f TRANSMITTER is approximately
equal to the resonator f C .
One or more of the following United States patents apply: 4,454,488
and 4,616,197.
Typically, equipment utilizing this device requires emissions testing
and government approval, which is the responsibility of the equipment
manufacturer.
Unless noted otherwise, case temperature T C = +25°C±2°C.
The design, manufacturing process, and specifications of this device
7.
8.
9.
are subject to change without notice.
Derived mathematically from one or more of the following directly
measured parameters: f C , IL, 3 dB bandwidth, f C versus T C , and C O .
Turnover temperature, T O , is the temperature of maximum (or
turnover) frequency, f O . The nominal frequency at any case
temperature, T C , may be calculated from: f = f O [1 - FTC (T O -T C ) 2 ].
Typically oscillator T O is approximately equal to the specified
resonator T O .
This equivalent RLC model approximates resonator performance near
the resonant frequency and is provided for reference only. The
capacitance C O is the static (nonmotional) capacitance between the
two terminals measured at low frequency (10 MHz) with a capacitance
meter. The measurement includes parasitic capacitance with "NC”
pads unconnected. Case parasitic capacitance is approximately
0.05 pF. Transducer parallel capacitance can by calculated as:
C P ≈ C O - 0.05 pF.
www.RFM.com E-mail: info@rfm.com
?2008 by RF Monolithics, Inc.
Page 1 of 2
RO2103A - 3/24/08
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